In-Situ Measurements of the Secondary Electron Yield in an Accelerator Environment: Instrumentation and Methods

@misc{hartungWed Dec 10 2014 21:39:34 GMT+0000 (Coordinated Universal Time)insitumeasurementssecondary,
      title={In-Situ Measurements of the Secondary Electron Yield in an Accelerator Environment: Instrumentation and Methods},
      author={W. H. Hartung and D. M. Asner and J. V. Conway and C. A. Dennett and S. Greenwald and J.-S. Kim and Y. Li and T. P. Moore and V. Omanovic and M. A. Palmer and C. R. Strohman},
      year={Wed Dec 10 2014 21:39:34 GMT+0000 (Coordinated Universal Time)},
      eprint={1412.3477},
      archivePrefix={arXiv},
      primaryClass={physics.acc-ph},
      url={https://arxiv.org/abs/1412.3477},
}