Hysteresis Measurements as a Diagnostic Tool: A Systematic Approach for Stability Benchmarking and Performance Projection of 2D-Materials-Based MOSFETs

@misc{karl2025hysteresismeasurementsdiagnostic,
      title={Hysteresis Measurements as a Diagnostic Tool: A Systematic Approach for Stability Benchmarking and Performance Projection of 2D-Materials-Based MOSFETs},
      author={Alexander Karl and Dominic Waldhoer and Theresia Knobloch and Axel Verdianu and Joël Kurzweil and Mina Bahrami and Mohammad Rasool Davoudi and Pedram Khakbaz and Bernhard Stampfer and Seyed Mehdi Sattari-Esfahlan and Yury Illarionov and Aftab Nazir and Changze Liu and Saptarshi Das and Xiao Renshaw Wang and Junchuan Tang and Yichi Zhang and Congwei Tan and Ye Li and Hailin Peng and Michael Waltl and Tibor Grasser},
      year={2025},
      eprint={2509.21315},
      archivePrefix={arXiv},
      primaryClass={physics.app-ph},
      url={https://arxiv.org/abs/2509.21315},
}