Recently, a single atom transistor was deterministically fabricated using phosphorus in Si by H-desorption lithography with a scanning tunneling microscope (STM). This milestone in precision, achieved by operating the STM in the conventional tunneling mode, typically utilizes very slow (
∼102 nm2/s) patterning speeds. By contrast, using the STM in a high voltage (
>10 V) field emission mode, patterning speeds can be increased by orders of magnitude to
≳104 nm2/s. We show that the rapid patterning negligibly affects the functionality of relatively large micron-sized features, which act as contacting pads on these devices. For nanoscale structures, we show that the resulting transport is consistent with the donor incorporation chemistry enhancing the device definition to a scale of
10 nm even though the pattering spot size is
40 nm.